Surface recombination measurements on III–V candidate materials for nanostructure light-emitting diodes
نویسندگان
چکیده
منابع مشابه
Surface recombination measurements on III–V candidate materials for nanostructure light-emitting diodes
Surface recombination is an important characteristic of an optoelectronic material. Although surface recombination is a limiting factor for very small devices it has not been studied intensively. We have investigated surface recombination velocity on the exposed surfaces of the AlGaN, InGaAs, and InGaAlP material systems by using absolute photoluminescence quantum efficiency measurements. Two o...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2000
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.372372